Keysight 82357B is a USB 2.0 to GPIB interface adapter allowing modern PCs to control GPIB instruments without a GPIB ca
PXI Express chassis backplane provides the PCIe-based high-speed data bus, PXI trigger lines, 10 MHz reference clock, an
Flying probe test systems use motorized probe arms with fine-tip probes that move to each test point under software cont
ICT (In-Circuit Test) bed-of-nails fixtures use spring-loaded pogo pins to simultaneously contact hundreds of test point
ATE (Automated Test Equipment) DUT (Device Under Test) board connectors provide the interface between the test handler a
USB logic sniffers (OpenBench Logic Sniffer, Saleae Logic) connect to PCBs via individual hook or pogo-pin leads with a
UART test headers on PCBs provide access to serial debug consoles on embedded systems. The standard 4-pin 2.54mm header
FTDI USB-Serial cable header is a 6-pin 2.54mm connector carrying USB-to-UART signals at 3.3V or 5V for programming Ardu
SWD (Serial Wire Debug, ARM CoreSight) uses just 2 signals (SWDIO and SWCLK) plus power and ground for debugging and pro
cJTAG (IEEE 1149.7) reduces JTAG from 4-5 wires to 2 wires (TMSC and TCKC) using a serialized protocol. Saves PCB space
JTAG boundary scan (IEEE 1149.1) uses a 14-pin or 20-pin header to test PCB interconnects, program FPGAs, and debug embe
LXI (LAN eXtensions for Instrumentation) uses standard RJ45 Gigabit Ethernet and IVI drivers for controlling modern test
VXI (VMEbus eXtensions for Instrumentation) uses the VME P1 and P2 backplane connectors for modular test instruments in
PXI Express (PCIe-based) uses a hybrid backplane combining PXI trigger bus with PCIe x4 or x8 high-speed data bus for mo
GPIB-to-USB adapters (Keysight 82357B, NI GPIB-USB-HS) convert the 24-pin GPIB bus to a USB interface allowing modern co
Keithley low thermal EMF connectors minimize thermoelectric voltages at connection junctions for accurate microvolt resi
Keithley triaxial connectors have three concentric conductors used on picoammeters and source-measure units. The Guard c
Fluke TL175 and TL910 CAT IV test leads with double-insulated silicone cables and shrouded banana plugs for safe measure
Hipot (High Potential / Dielectric Withstand) test leads handle voltages up to 10kV for testing electrical insulation in
Megger insulation resistance test leads handle up to 1000V DC for testing insulation resistance in motors, transformers,
EMC near-field probe sets contain loop (magnetic H-field) and stub (electric E-field) probes with SMA connectors for loc
Power rail probes (like Tektronix TPR1000) have very low input impedance (50 ohm) and high offset capability for measuri
Current probes clamp around a conductor and output a voltage proportional to the current via a BNC connector. Hall effec
Flying lead probes are individual thin flexible test leads with micro-hooks or pogo pins at the tip for connecting to fi