EMC near-field probe sets contain loop (magnetic H-field) and stub (electric E-field) probes with SMA connectors for locating EMI sources on PCBs during pre-compliance testing with a spectrum analyzer.
| Pin | Name | Function | Type |
|---|---|---|---|
| 1 | SMA Center | Measured field signal output | ADC |
| 2 | SMA Shell | Ground and shielding | GND |
EMC near-field probe sets contain loop (magnetic H-field) and stub (electric E-field) probes with SMA connectors for locating EMI sources on PCBs during pre-compliance testing with a spectrum analyzer.