// Test and Measurement Connectors

ATE DUT Connector

ATE (Automated Test Equipment) DUT (Device Under Test) board connectors provide the interface between the test handler and the device being tested, including high-frequency RF contacts, power contacts, and signal contacts.

// Specifications

Standard

Vendor specific ATE interface

Contact Types

RF signal power and ground

Insertion Force

ZIF or low insertion force

Cycles

100000 to 500000 rated

Use Case

Production test semiconductor IC testing

Systems

Teradyne Advantest National Instruments

// Pin Reference Table

Pin	Name	Function	Type
1	Signal Contacts	Device signal I/O contacts	I/O
2	Power	Device supply voltage contacts	PWR
3	RF	RF measurement contacts 50 ohm	BUS
4	GND	Ground contacts	GND