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ATE DUT Connector

ATE (Automated Test Equipment) DUT (Device Under Test) board connectors provide the interface between the test handler and the device being tested, including high-frequency RF contacts, power contacts, and signal contacts.

// connector diagram 4 pins
// loading diagram...
// Specifications
Standard
Vendor specific ATE interface
Contact Types
RF signal power and ground
Insertion Force
ZIF or low insertion force
Cycles
100000 to 500000 rated
Use Case
Production test semiconductor IC testing
Systems
Teradyne Advantest National Instruments
// Pin Reference Table
PinNameFunctionType
1 Signal Contacts Device signal I/O contacts I/O
2 Power Device supply voltage contacts PWR
3 RF RF measurement contacts 50 ohm BUS
4 GND Ground contacts GND

ATE (Automated Test Equipment) DUT (Device Under Test) board connectors provide the interface between the test handler and the device being tested, including high-frequency RF contacts, power contacts, and signal contacts.